명암비 향상 필름을 채용한 플라즈마 디스플레이 패널의 고스트 현상 및 명실 명암비 측정 시스템 모델링에 관한 연구

Abstract

In this thesis, we have studied the ghost image phenomenon of plasma display panels (PDPs) adopting a contrast enhancement film (CEF) and performed the modeling and simulation of a bright-room contrast ratio (BRCR) measurement system by using an illumination design tool. First, an imaging optical system was designed and used for simulating the ghost image phenomenon. The ghost image phenomenon is strongly affected by the film orientation relative to the PDP module and the difference between the refractive index of the ultraviolet (UV) curable layer and that of the black stripes (BSs). We have found that when the top side of the BSs faced the PDP module and the refractive index difference was small, the ghost image phenomenon was weakened. Next, a simple model of the BRCR measurement system was developed on the basis of the International Electrotechnical Commission (IEC) measurement standard. In the model, only four model parameters were used: flux of fluorescent lamps, scattering rate of the PDP module, illuminance of the white pattern, and absorption coefficient of the color adjusting film (CAF). The values of the model parameters were determined by matching simulations, and the model was employed for simulating the BRCR values of the PDP module in the case of four different CEF samples. The simulated results were found to be in agreement with the experimental results within an error of about 10%. The results of the ghost image simulations reported in this thesis will provide useful fundamental information for CEF design. In addition, the model developed in this study can be utilized for the development of high-performance CEFs through optimization of the optical and structural parameters.